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Catalog No. THM-ELITE
Part No. ELITE
Supplier Thermo Fisher Scientific Inc.
ELITE System
Net Price
Special offer
Availability

6 weeks

DESCRIPTION
The rapid growth in advanced packaging applications, complex interconnect schemes and higher performance power devices is creating unprecedented failure localization and analysis challenges. Defective or underperforming semiconductor devices often show an anomalous distribution of the local power dissipation, leading to local temperature increases. Thermo Scientific ELITE system utilizes Lock-in IR Thermography (LIT) to accurately and efficiently locate these areas of interest.
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