DESCRIPTION
High-quality observation and characterization of materials often require an artifact-free surface, which can be difficult to achieve with traditional polishing techniques like grinding or mechanical polishing. The Thermo Scientific™ CleanMill Broad Ion Beam System is a complete ion beam polishing solution for SEM applications in materials science, enabling optimal imaging and analysis of materials where a pristine surface is required, including beam- and air-sensitive materials.The CleanMill System is fully compatible with the Thermo Scientific™ CleanConnect Sample Transfer System, making it easy to quickly transfer samples between instruments while minimizing sample handling.Find more information: CleanMill Broad Ion Beam System
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